High Resolution X Ray Scattering Thin (22 results)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Berlin, Springer, 1999
Series: Springer Tracts in Modern Physics, Book 59 of 227. Book 59 of 227 - Springer Tracts in Modern Physics
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Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm
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Hardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.
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- Softcover
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- Hardcover
Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm
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Hardcover. 2nd ed. XVI, 408 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05638 9780387400921 Sprache: Englisch Gewicht in Gramm: 550.
- Softcover
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- Softcover
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- Softcover
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- Softcover
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- Hardcover
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
- Hardcover
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£ 28.19
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magne…tic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
- Hardcover
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- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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£ 119.01
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Paperback. Condition: Brand New. 2nd edition. 410 pages. 9.00x6.00x1.00 inches. In Stock.
- Hardcover
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- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic,…and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 146.31
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High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
Language: English
Published by Springer, 1998
Series: Springer Tracts in Modern Physics, Book 59 of 227. Book 59 of 227 - Springer Tracts in Modern Physics
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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£ 210.00
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Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
More images- Softcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
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£ 74.35
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Taschenbuch. Condition: Neu. High-Resolution X-Ray Scattering | From Thin Films to Lateral Nanostructures | Ullrich Pietsch (u. a.) | Taschenbuch | Advanced Texts in Physics | xvi | Englisch | 2011 | Springer | EAN 9781441923073 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juerg…en[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
- Hardcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
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£ 140.07
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Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
