Gilfrich (120 results)

Condition: New.

Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Hardcover. Condition: Very Good. Hardcover; Volume 32 only; proceedings of the 37th annual conference on App lications of X-Ray Analysis, held August 1-5, 1988, in Steamboat Springs, C olorado; light fading and shelf wear to exterior; former owner's stamping o n front endpaper; a few small spots at top page edge; in very good conditio n with clean text, firm binding. Dust jacket shows light scuffing and shelf wear.…

Condition: New.

Condition: New.

Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Oct. 26 (weekend SALE item) 710 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. …

Hardcover. Condition: Very Good. 1. With dust jacket. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Taschenbuch. Condition: Neu. Neuware - This work has been selected by scholars as being culturally important and is part of the knowledge base of civilization as we know it.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. To ensure a quality reading experience, this work has been proofread and republished using a format that seamlessly blends the original graphical elements with text in an easy-to-read typeface.We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.…

Condition: New.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

hardcover. Condition: Very Good. Plenum Press, NY c.1991, 8vo. cloth, 743pp. F/F $.

Condition: Gut. 76 Seiten Ehem. Bibliotheksexemplar mit Stempel und Signatur. GUTER Zustand, ein paar sichtbare Gebrauchsspuren, Einband bestoßen. Kleinere Anstreichungen möglich. Ex-library in GOOD condition with stamp and signature, some visible traces of use. (3181 a M) Sprache: Englisch Gewicht in Gramm: 510.…

Condition: New.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

Condition: New. pp. 1334.

Condition: New. pp. 1334 1st Edition.

Condition: New. In English.

Condition: New. In English.

Condition: New. In English.

Condition: New. pp. 1334.

Condition: New. pp. 648.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.…

Condition: New. pp. 712.

Condition: New. pp. 784.

Condition: New.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. …

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.…