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Pavlov, Andrei; Sachdev, Manoj (15 results)
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hardcover. Condition: As New. Ships Out Tomorrow!
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Condition: New.
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Condition: New.
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Condition: New.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 134.13
Convert currency£ 11.98 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 134.12
Convert currency£ 15 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 147.03
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Add to basketCondition: As New. Unread book in perfect condition.
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£ 106.79
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Add to basketCondition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
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£ 106.79
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Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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£ 208
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Condition: As New. Unread book in perfect condition.
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£ 231
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Add to basketHardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by Springer Netherlands, 2010
ISBN 10: 904817855X ISBN 13: 9789048178551
Language: English
£ 129.88
Convert currency£ 42.62 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by Springer Netherlands, 2008
ISBN 10: 1402083629 ISBN 13: 9781402083624
Language: English
£ 130.93
Convert currency£ 42.62 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
