CMOS Sram Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware Sram Design and Test

Book 21 of 40: Frontiers in Electronic Testing

Pavlov, Andrei

ISBN 10: 1402083629 ISBN 13: 9781402083624
Published by Springer, 2008
Language: English
Condition: Used Hardcover

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Used - Hardcover

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