CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)

Pavlov, Andrei; Sachdev, Manoj

ISBN 10: 904817855X ISBN 13: 9789048178551
Published by Springer, 2010
Language: English
Condition: New Soft cover

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