Order Total (1 Item Items):
Shipping Destination:
Andrei Pavlov Manoj Sachdev (12 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (12)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (8)
- As New, Fine or Near Fine (4)
- Very Good or Good (No further results match this refinement)
- Fair or Poor (No further results match this refinement)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (6)
- Not Print on Demand (8)
Language (1)
Price
- Any Price
- Under £ 20 (No further results match this refinement)
- £ 20 to £ 40 (No further results match this refinement)
- Over £ 40
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Book 21 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 136.79
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
-
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 136.78
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
-
Paperback. Condition: Like New. Like New. book.
-
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
£ 238.99
£ 15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
Hardcover. Condition: Like New. Like New. book.
-
Condition: As New. Unread book in perfect condition.
-
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer Netherlands, 2008
ISBN 10: 1402083629 ISBN 13: 9781402083624
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
-
Condition: New. PRINT ON DEMAND pp. 212.
-
Condition: New. Print on Demand pp. 212 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
-
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingLanguage: English
Published by Springer Netherlands, 2010
ISBN 10: 904817855X ISBN 13: 9789048178551
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
