Title: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing (40))
Publisher: Springer
Publication Date: 2010
Language: English
ISBN 10: 904817855X
ISBN 13: 9789048178551
Binding: Paperback
Condition: Like New
Book Type: book

About this title

Synopsis

This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing.

About the Author

Prof. Sachdev has authored several successful books with Springer

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