Order Total (1 Item Items):
Shipping Destination:
Vlsi Test Principles Architectures by Wang Laung Terng (15 results)
Feedback
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (15)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition
Binding
Collectible Attributes
- First Edition (1)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (2)
- Not Print on Demand (14)
Language (1)
Free Shipping
- Free Shipping to United Kingdom (No further results match this refinement)
Seller Location
Seller Rating
-
VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)).
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
First Edition
£ 14.11
Convert currency£ 10.28 shipping from Germany to United KingdomQuantity: 1 available
Add to basket1st ed. 21 x 24 cm. 808 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
-
£ 35.86
Convert currency£ 12.84 shipping from Germany to United KingdomQuantity: 1 available
Add to basketCondition: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.
-
VLSI Test Principles and Architectures,: Design for Testability (Systems on Silicon)
Published by Morgan Kaufmann 2006-08-14, 2006
ISBN 10: 0123705975 ISBN 13: 9780123705976
Language: English
£ 57.20
Convert currency£ 2.49 shipping within United KingdomQuantity: Over 20 available
Add to basketHardcover. Condition: New.
-
Condition: New. pp. xxx + 777 Illus.
-
Hardcover. Condition: Brand New. 1st edition. 777 pages. 9.25x7.50x2.00 inches. In Stock.
-
£ 85.74
Convert currency£ 6.64 shipping from U.S.A. to United KingdomQuantity: 3 available
Add to basketCondition: New. pp. xxx + 777.
-
£ 89.42
Convert currency£ 6.81 shipping from Germany to United KingdomQuantity: 3 available
Add to basketCondition: New. pp. xxx + 777.
-
Paperback. Condition: Brand New. 1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.
-
£ 102.81
Convert currency£ 25.84 shipping from U.S.A. to United KingdomQuantity: 2 available
Add to basketHardcover. Condition: Good. Textbook, May Have Highlights, Notes and/or Underlining, BOOK ONLYNO ACCESS CODE, NO CD, Ships with Emailed Tracking.
-
£ 105.53
Convert currency£ 32.48 shipping from U.S.A. to United KingdomQuantity: 1 available
Add to baskethardcover. Condition: New. In shrink wrap. Looks like an interesting title!
-
£ 55.96
Convert currency£ 84.90 shipping from U.S.A. to United KingdomQuantity: 1 available
Add to basketHardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
£ 55.96
Convert currency£ 84.90 shipping from U.S.A. to United KingdomQuantity: 1 available
Add to basketHardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
-
£ 128.31
Convert currency£ 22.15 shipping from U.S.A. to United KingdomQuantity: 1 available
Add to basketHardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
-
VLSI Test Principles and Architectures: Design for Testability
Published by Morgan Kaufmann Publishers, 2006
ISBN 10: 1493300865 ISBN 13: 9781493300860
Language: English
Paperback. Condition: New. New. book.
-
£ 60.42
Convert currency£ 3 shipping from Italy to United KingdomQuantity: Over 20 available
Add to basketCondition: new. Questo è un articolo print on demand.
