VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

Wang, Laung-Terng, Cheng-Wen Wu and Xiaoqing Wen:

ISBN 10: 0123705975 ISBN 13: 9780123705976
Published by Morgan Kaufmann, 2006
Language: English
Condition: Used - Very good Hardcover

Sold by diakonia secondhand, München, Germany

AbeBooks Seller since 9 February 2021

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


Used - Hardcover

Condition: Used - Very good

Price:
£ 36.53
£ 30.53 shipping
Ships from Germany to U.S.A.

Quantity: 1 available

Add to basket