VLSI Test Principles and Architectures

Language: English

Published by Morgan Kaufmann, 2006

1493300865 / 9781493300860

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Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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Softcover

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1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.

Seller Inventory # zk1493300865

Title
VLSI Test Principles and Architectures
Author
Wang, Laung-Terng/ Wu, Cheng-Wen/ Wen, Xiaoqing
Publisher
Morgan Kaufmann
Publication year
2006
Condition
Brand New
Binding
Paperback
Language
English
ISBN 10
1493300865
ISBN 13
9781493300860
Item weight
1.71 kilograms

Revaluation Books

Exeter, United Kingdom

5-star seller

AbeBooks seller since January 6, 2003

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Edward Bowditch Ltd

Exstowe, Exton
Exeter, United Kingdom EX3 0PP