VLSI Test Principles and Architectures

Wang, Laung-Terng/ Wu, Cheng-Wen/ Wen, Xiaoqing

ISBN 10: 1493300865 / ISBN 13: 9781493300860

Published by Morgan Kaufmann, 2006

About this Item

1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock. Seller Inventory # zk1493300865

Bibliographic Details

Title: VLSI Test Principles and Architectures

Publisher: Morgan Kaufmann

Publication Date: 2006

Binding: Paperback

Condition: Brand New

About this title

Synopsis:

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

Review:

In the era of large systems embedded in a single system-on-chip (SOC) and fabricated continuously shrinking technologies, it is important to ensure correct behavior of the whole system. Electronic design and test engineers of today have to deal with these complex and heterogeneous systems (digital, mixed-signal, memory), but few have the possibility to study the whole field in a detailed and deep way. This book provides an extremely broad knowledge of the discipline, covering the fundamentals in detail, as well as the most recent and advanced concepts.
Michel Renovell, Laboratoire d Informatique, de Robotique et de Microelectronique de Montpellier (LIRMM), Montpellier, France
This book combines in a unique way insight into industry practices commonly found in commercial DFT tools but not discussed in textbooks, and a sound treatment of the future fundamentals. The comprehensive review of future test technology trends, including self-repair, soft error protection, MEMS testing, and RF testing, leads students and researchers to advanced DFT research.
Hans-Joachim Wunderlich, University of Stuttgart, Germany
Recent advances in semiconductor manufacturing have made design for testability (DFT) an essential part of nanometer designs. I am pleased to find a DFT textbook of this comprehensiveness that can serve both academic and professional needs.
Andre Ivanov, University of British Columbia, Canada
This is the most recent book covering all aspects of digital systems testing. It is a must read for anyone focused on learning modern test issues, test research, and test practices.
Kewal K. Saluja, University of Wisconsin-Madison
By covering the basic DFT theory and methodology on digital, memory, as well as analog and mixed-signal (AMS) testing, this book stands out as one best reference book that equips practitioners with testable SOC design skills.
Yihe Sun, Tsinghua University, Beijing, China"