Semiconductor Device Failure Analysis by Chim Wai (15 results)

hardcover. Condition: Very Good.

Condition: Very Good. : Este libro detalla la técnica PEM y su aplicación al análisis de dispositivos semiconductores. Ilustra la aplicación de la técnica PEM en varias áreas de la confiabilidad de los dispositivos, en particular la confiabilidad de portadores calientes, óxidos y ESD. Presenta los principios de diseño y calibración para un sistema de microscopio de emisión espectroscópica junto con la cobertura de los tres modos de operación principales: frontal, posterior y PEM espectroscópica. Proporciona un análisis de la emisión de luz en semiconductores bajo portadores calientes y estrés de impulso de alto campo en transistores MOS y emisión de fotones de capacitores MOS polarizados. EAN: 9780471492405 Tipo: Libros Categoría: Tecnología|Ciencias Título: Semiconductor Device and Failure Analysis Autor: Wai Kin Chim Editorial: Wiley Idioma: en Páginas: 288 Formato: tapa dura.…

Condition: Good.

HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

Condition: new.

Condition: New.

Condition: New.

Condition: New. In English.

Condition: As New. Unread book in perfect condition.

Condition: As New. Unread book in perfect condition.

Condition: New.

Hardcover. Condition: Brand New. 1st edition. 269 pages. 9.25x6.25x1.00 inches. In Stock.

Hardcover. Condition: new. Hardcover. The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference: * Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and ESD reliability. * Presents the principles of design and calibration for a spectroscopic emission microscope system along with coverage of the three main operation modes: frontside, backside and spectroscopic PEM * Provides an analysis of light emission in semiconductors under hot-carrier and high-field impulse stressing in MOS transistors and photon emission from biased MOS capacitors. Not only an essential reference for researchers and students in the field, the numerous practical examples throughout the text also make this an indispensible guide for failure analysis engineers and microelectrics industry professionals. Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.…

Condition: New. pp. xv + 269 Illus. This item is printed on demand.

Hardcover. Condition: Brand New. 1st edition. 269 pages. 9.25x6.25x1.00 inches. In Stock. This item is printed on demand.