Semiconductor Device and Failure Analysis (Hardcover)

Language: English

Published by John Wiley & Sons Inc, New York, 2000

047149240X / 9780471492405

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Hardcover. The diminishing size and greater complexity of modern semiconductor integrated circuits poses new challenges in fault detection. Photon Emission Microscopy (PEM) is a physical fault localisation technique used for analysing IC failures. Detailing the PEM technique and its application to semiconductor device analysis, this unique reference: * Illustrates the application of the PEM technique in various areas of device reliability, in particular hot-carrier, oxide and ESD reliability. * Presents the principles of design and calibration for a spectroscopic emission microscope system along with coverage of the three main operation modes: frontside, backside and spectroscopic PEM * Provides an analysis of light emission in semiconductors under hot-carrier and high-field impulse stressing in MOS transistors and photon emission from biased MOS capacitors. Not only an essential reference for researchers and students in the field, the numerous practical examples throughout the text also make this an indispensible guide for failure analysis engineers and microelectrics industry professionals. Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.

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Title
Semiconductor Device and Failure Analysis (Hardcover)
Author
Wai Kin Chim
Publisher
John Wiley & Sons Inc, New York
Publication year
2000
Condition
new
Binding
Hardcover
Language
English
ISBN 10
047149240X
ISBN 13
9780471492405
Edition
1st Edition

CitiRetail

Stevenage, United Kingdom

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AbeBooks seller since June 29, 2022

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