Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy

Language: English

Published by Wiley, 2000

047149240X / 9780471492405

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Title
Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy
Author
Chim, Wai Kin
Publisher
Wiley
Publication year
2000
Condition
Very Good
Binding
hardcover
Language
English
ISBN 10
047149240X
ISBN 13
9780471492405

Books From California

Simi Valley, CA, U.S.A.

4-star seller

AbeBooks seller since August 14, 2001

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