Semiconductor Device and Failure Analysis Using Photon Emmission Microscopy: Using Photon Emission Microscopy (Quality and Reliability Engineering Series)

Language: English

Published by Wiley, 2000

047149240X / 9780471492405

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Title
Semiconductor Device and Failure Analysis Using Photon Emmission Microscopy: Using Photon Emission Microscopy (Quality and Reliability Engineering Series)
Author
Chim, Wai Kin
Publisher
Wiley
Publication year
2000
Condition
Good
Binding
Hardcover
Language
English
ISBN 10
047149240X
ISBN 13
9780471492405

Buchmarie

Darmstadt, Germany

5-star seller

AbeBooks seller since June 21, 2021

Shipping rates from Germany to U.S.A.

Item25 to 45 business days8 to 14 business days
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