Scanning Force Microscopy Applications by Sarid Dror (17 results)

Hardback. Condition: Good. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. …

Hardback. Condition: Good. Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. …

Hardcover. Condition: Good. 2nd Edition. REVISED HARDBACK BOOK IN GOOD TO VERY GOOD CONDITION,BOOK IS SLIGHTLY TWISTED.

Hard Back. Condition: Very Good. No Dust Jacket. Revised Edition - Third Printing. 263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanning Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list of new references that deal with electric, magnetic, and atomic force microscopy. It should also be noted that several scanning force microscopy related reviews have appeared, some of which present detailed information on specialized topics. Contents in 13 Chapters: Mechanical Properties of Levers, Resonance Enhancement, Sources of Noise, Tuneling Detection System, Capacitance Detection System, Homodyne Detection System, Heterodyne Detection System, Laser-Diode Feedback Detection System, Polarization Detection System, Deflection System, Electric Force Microscopy, Magnetic Force Microscopy, and Atomic Force Microscopy. …

Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780195092042.

hardcover. Condition: Good. Hardcover ex-library with typical marks shows moderate cover wear. Text is unmarked. Ships FAST.

Condition: Sehr gut. Zustand: Sehr gut | Seiten: 284 | Sprache: Englisch | Produktart: Bücher | This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. …

Hardcover. Condition: New. In shrink wrap. Looks like an interesting title.

Condition: New.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. In English.

Condition: As New. Unread book in perfect condition.

Condition: New. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Series: Oxford Series in Optical & Imaging Sciences. Num Pages: 288 pages, halftones, line drawings, tables. BIC Classification: PDND; PHV. Category: (P) Professional & Vocational. Dimension: 242 x 161 x 21. Weight in Grams: 667. . 1994. Revised. hardcover. . . . .…

Condition: New. This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed. Series: Oxford Series in Optical & Imaging Sciences. Num Pages: 288 pages, halftones, line drawings, tables. BIC Classification: PDND; PHV. Category: (P) Professional & Vocational. Dimension: 242 x 161 x 21. Weight in Grams: 667. . 1994. Revised. hardcover. . . . . Books ship from the US and Ireland.…

Condition: new. Questo è un articolo print on demand.

Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.…