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Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces: 5 (Oxford Series in Optical and Imaging Sciences) - Hardcover
Synopsis
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries.
This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
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Product Description
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
Review
From reviews of the first edition: `instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.'Journal of Colloid and Interface Science L`A valuable contribution to the literature, providing a sound theoretical basis.'Journal of Solid State Chemistry
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series on Optical and Imaging Sciences)
Published by
U.S.A.: Oxford University Press, 1994
ISBN 10: 019509204X
ISBN 13: 9780195092042
Used
Hardcover
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Hardcover. Condition: Good. 2nd Edition. REVISED HARDBACK BOOK IN GOOD TO VERY GOOD CONDITION,BOOK IS SLIGHTLY TWISTED. Seller Inventory # 306503
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
Published by
Oxford University Press, 1994
ISBN 10: 019509204X
ISBN 13: 9780195092042
Used
Hardcover
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Seller rating 5 out of 5 stars
Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:019509204X. Seller Inventory # 9474796
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
Published by
Oxford University Press, 1994
ISBN 10: 019509204X
ISBN 13: 9780195092042
Used
Hardcover
Seller: Anybook.com, Lincoln, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780195092042. Seller Inventory # 9884117
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces - Oxford Series in Optical and Imaging Sciences - Revised Edition
Published by
Oxford University Press, New York, 1994
ISBN 10: 019509204X
ISBN 13: 9780195092042
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Hardcover
Seller: Don's Book Store, Albuquerque, NM, U.S.A.
Seller rating 5 out of 5 stars
Hard Back. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. Revised Edition - Third Printing. 263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanning Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list of new references that deal with electric, magnetic, and atomic force microscopy. It should also be noted that several scanning force microscopy related reviews have appeared, some of which present detailed information on specialized topics. Contents in 13 Chapters: Mechanical Properties of Levers, Resonance Enhancement, Sources of Noise, Tuneling Detection System, Capacitance Detection System, Homodyne Detection System, Heterodyne Detection System, Laser-Diode Feedback Detection System, Polarization Detection System, Deflection System, Electric Force Microscopy, Magnetic Force Microscopy, and Atomic Force Microscopy. Seller Inventory # 16182
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
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Scanning Force Microscopy
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Oxford University Press Inc, 1994
ISBN 10: 019509204X
ISBN 13: 9780195092042
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Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences)
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Scanning Force Microscopy
Published by
Oxford University Press Inc, 1994
ISBN 10: 019509204X
ISBN 13: 9780195092042
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