Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces - Hardcover

Sarid, Dror

Hardcover

ISBN 10: 0195062701 ISBN 13: 9780195062700

Publisher: Oxford University Press Inc, 1991

Synopsis

Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.

About this title

Review

From reviews of the first edition: `instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.'Journal of Colloid and Interface Science L`A valuable contribution to the literature, providing a sound theoretical basis.'Journal of Solid State Chemistry

Synopsis

Discusses scanning tunneling microscopy (STM), a technique wich enables one to obtain images reflecting surface electronic structure with atomic resolution, in an attempt to organize the range of topics dealing with the mapping of a variety of forces across surfaces.

Edition details

• Publisher: Oxford University Press Inc
• Publication date: 1991
• Language: English
• ISBN 10: 0195062701
• ISBN 13: 9780195062700
• Binding: Hardcover
• Number of pages: 270