Large Scale Integration Design (183 results)

Condition: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. Damage to backstrip Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1000grams, ISBN:0138545545.…

Pappband. Condition: Befriedigend. 242 Seiten folienkaschiertes exBibliotheksexemplar mit den üblichen Stempeln/Signaturen, Kanten gering bestossen /// Standort Wimregal HAA-27701 ISBN 0201144026 WITHIN THE EU: shipping only to GERMANY and AUSTRIA due to the new EPR regulations. Sprache: Englisch Gewicht in Gramm: 634.…

Hardcover. Condition: Good. Hardcover; surplus library copy with the usual stampings; fading, shelf wea r, and light soiling to exterior; in good condition with clean text, firm b inding. No dust jacket.

Hardcover. Condition: Very Good +. No Jacket. First UK Edition. Laminated paper-covered boards. Volume V in the Microelectronics and Signal Processing Series by this publisher. Series editors: P.G. Farrell and J.R. Forrest. With numerous figures. Clean, tight, and unworn.

Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Dust jacket in fair condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:0471079375.…

Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1100grams, ISBN:0132019302.

Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0471052221.…

Brossura. Condition: fine. English Text.West Sussex, 1975; paperback, pp. 374. Libro.

Paperback. Condition: Used; Good. ***Simply Brit*** Welcome to our online used book store, where affordability meets great quality. Dive into a world of captivating reads without breaking the bank. We take pride in offering a wide selection of used books, from classics to hidden gems, ensuring there is something for every literary palate. All orders are shipped within 24 hours and our lightning fast-delivery within 48 hours coupled with our prompt customer service ensures a smooth journey from ordering to delivery. Discover the joy of reading with us, your trusted source for affordable books that do not compromise on quality.…

Paperback. Condition: Used; Very Good. **SHIPPED FROM UK** We believe you will be completely satisfied with our quick and reliable service. All orders are dispatched as swiftly as possible! Buy with confidence! Greener Books.

Condition: New.

Condition: New.

Condition: New.

Hardcover. Condition: Good. Publisher: Computer Science Press, 1983, Good, HB, ISBN: 0-914894-86-2, EX-REFERENCE BOOK, cover chips/scuffed. Ex-Library.

Hardback or Cased Book. Condition: New. Vlsi-Soc: Technology Advancement on Soc Design: 29th Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2021, Singap. Book.

Hardback or Cased Book. Condition: New. Vlsi-Soc: Forward-Looking Trends in IC and Systems Design: 18th Ifip Wg 10.5/IEEE International Conference on Very Large Scale Integration, Vlsi-Soc 2. Book.

Condition: New.

Condition: New.

Condition: New.

Condition: New.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Academic Paper from the year 2024 in the subject Computer Sciences - Artificial Intelligence, , language: English, abstract: Our book provides a succinct summary of Artificial Intelligence applications across multiple Very-Large-Scale Integration (VLSI) design flow and testing domains. One technique of fabrication, CMOS technology, is where the evolution of VLSI begins. Complementary Metal Oxide Semiconductor (CMOS) offers numerous advantages but to pack high number of Integrated Circuits (ICs) in compact geometries, VLSI enters into picture. We can design VLSI using Computer Aided Tools like Electronic Design Automation (EDA). VLSI design consists of two primary parts: the front end and the back end. Fabrication procedures such as Architectural Design, Gate Level Design, Simulation, Hardware Descriptive Language (HDL), Circuit Level Design, Verification, and Fabrication are included at the back end. Descriptive languages for hardware are the main emphasis of front end. HDL is essential to system design use because it enables the behavior of the core system to be verified and modelled prior to the design being converted by synthesis tools into physical hardware, such as gates and wires. Different chemical and physical processes are needed for the backend operations. It is possible to create Artificial Intelligence algorithms that aid in raising the yield of physical processes. Artificial Intelligence and Machine Learning (AI-ML) algorithms assist in predicting parametric yield at the device level. Furthermore AI-ML algorithms are implemented at the gate level to analyse the total latency of the gate connection. Also, AI-ML algorithms can be used at the circuit level to maximize the performance of circuits. A combination of AI-ML algorithms in EDA tools allows for the examination of propagation delay, power leakage, etc. During lithography, transfer learning can be used to produce data. Effective testing becomes a crucial task as electronic systems and components becoming more complex, striking a balance between the need for high quality and cost effectiveness. In spite of its labour-intensive nature, testing has become a critical technique for cutting total costs in the production of electronic systems, boards, and VLSI chips. It plays a critical role in ensuring that VLSI design satisfy quality requirement by identifying circuit faults. In order to handle the complexity of contemporary systems, recent developments have incorporated machine learning (ML) and artificial intelligence (AI) into established VLSI testing techniques.…

Condition: As New. Unread book in perfect condition.

Condition: As New. Unread book in perfect condition.

Condition: As New. Unread book in perfect condition.

Hardcover. Condition: Good. No Jacket. 1st Edition. 2004.Hardcover.Good condition.490 pages.Ships from Japan.Usually ships in 1-2 working days.

Condition: As New. Unread book in perfect condition.

paperback. Condition: Good.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. In English.