Order Total (1 Item Items):
Shipping Destination:
Influence Temperature Microelectronics System by Pecht Michael (26 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (26)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (17)
- As New, Fine or Near Fine (6)
- Very Good or Good (1)
- Fair or Poor (2)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (2)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (9)
- Not Print on Demand (24)
Language (1)
Free Shipping
Seller Location
Seller Rating
-
Hardcover. Condition: Fair. No Jacket. 1st Edition. This book is seriously flawed by the fact that pages 289 to 307 function as an insert. They are completely separated from the binding. But the book is all there and is otherwise in new condition. There are no tears or signs of wear to the clean pages or the cover.
-
Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach (Electronic Packaging Series)
Book 4 of 4: Electronic PackagingLanguage: English
Published by CRC Press, Boca Raton, FL, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
Seller: Dorley House Books, Inc., Hagerstown, MD, U.S.A.
Seller rating 4 out of 5 stars
First Edition
Hardcover. Condition: Near Fine. B/W Photos; Diagrams, Etc (illustrator). 1st. 1st printing; glossy pictorial c; 307 clean, unmarked pages.
-
Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
-
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
-
Condition: As New. Unread book in perfect condition.
-
-
-
-
-
Condition: New. 1st edition NO-PA16APR2015-KAP.
-
Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Influence of Temperature on Microelectronics and System Reliability
Book 4 of 4: Electronic PackagingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 49.30
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
-
Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
-
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
-
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
Book 4 of 4: Electronic PackagingLanguage: English
Published by Taylor & Francis Ltd, 2019
ISBN 10: 0367400979 ISBN 13: 9780367400972
Paperback. Condition: Brand New. 336 pages. 10.00x7.01x0.67 inches. In Stock.
-
Influence of Temperature on Microelectronics and System Reliability
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Hardcover. Condition: Like New. Like NewLIKE NEW. book.
-
Condition: As New. Unread book in perfect condition.
-
Influence of Temperature on Microelectronics and System Reliability
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
-
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)
Book 4 of 4: Electronic PackagingLanguage: English
Published by Taylor & Francis Group, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
Condition: New. pp. 336 1st Edition.
-
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)
Book 4 of 4: Electronic PackagingLanguage: English
Published by CRC Press 1997-04-24, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
Hardcover. Condition: New.
-
Influence of Temperature on Microelectronics System Reliability
Book 4 of 4: Electronic PackagingLanguage: English
Published by Taylor & Francis Group, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
Condition: New. pp. 336 400 equations This item is printed on demand.
-
Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)
Book 4 of 4: Electronic PackagingLanguage: English
Published by Taylor & Francis Group, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
Condition: New. PRINT ON DEMAND pp. 336.
