Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Lall, Pradeep; Pecht, Michael G.; Hakim, Edward B.

ISBN 10: 0849394503 ISBN 13: 9780849394508
Published by CRC Press, 1997
Language: English
Condition: Used - Fair Hardcover

Sold by Budget Books, Pasadena, CA, U.S.A.

AbeBooks Seller since 26 June 2023

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


Used - Hardcover

Condition: Used - Fair

Price:
£ 9.39
£ 3.04 shipping within U.S.A.

Quantity: 1 available

Add to basket