Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach

Book 4 of 4: Electronic Packaging

Lall, Pradeep/ Pecht, Michael G./ Hakim, Edward B.

ISBN 10: 0367400979 ISBN 13: 9780367400972
Published by Taylor & Francis Ltd, 2019
Language: English
Condition: New Soft cover

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