Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Book 4 of 4: Electronic Packaging

Lall, Pradeep; Pecht, Michael; Hakim, Edward B.

ISBN 10: 0849394503 ISBN 13: 9780849394508
Published by CRC Press, 1997
Language: English
Condition: New Hardcover

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