Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)

Book 4 of 4: Electronic Packaging

Pradeep Lall, Michael Pecht, Edward B. Hakim

ISBN 10: 0849394503 ISBN 13: 9780849394508
Published by CRC Press 1997-04-24, 1997
Language: English
Condition: New Hardcover

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