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Digital Integrated Circuit Testing by Hnatek Eugene (19 results)
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Digital Integrated Circuit Testing from a Quality Perspective
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Condition: New.
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Condition: As New. Unread book in perfect condition.
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Digital Integrated Circuit Testing from a Quality Perspective
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Digital Integrated Circuit Testing from a Quality Perspective
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 96.88
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Springer US, Springer Aug 1993, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Buch. Condition: Neu. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Van Nostrand Reinhold Inc.,U.S., 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. New copy - Usually dispatched within 4 working days.
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Condition: New. pp. 196.
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Buch. Condition: Neu. Digital Integrated Circuit Testing from a Quality Perspective | Eugene R. Hnatek | Buch | Einband - fest (Hardcover) | Englisch | 1993 | Springer | EAN 9780442006433 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbieter: preigu.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Springer US, Springer, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Springer US, Springer Aug 1993, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Buch. Condition: Neu. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Springer US, Springer Aug 1993, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Seller: Rheinberg-Buch Andreas Meier eK, Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Springer US, Springer Aug 1993, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Preface. Part One: Pharyngolaryngectomy: reconstruction by myocutaneous flaps Pharyngolaryngectomy: reconstruction by free jejunal transfer with microvascular anastomosis Pharyngolaryngo-oesophagectomy: reconstruction by colonic transposition Pharyng.
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Hardcover. Condition: Brand New. 9.50x6.25x0.75 inches. In Stock. This item is printed on demand.
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Condition: New. Print on Demand pp. 196 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 196.
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Digital Integrated Circuit Testing from a Quality Perspective
Language: English
Published by Springer US, Springer Aug 1993, 1993
ISBN 10: 0442006438 ISBN 13: 9780442006433
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from aSpringer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 194 pp. Englisch.
