Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering) - Hardcover

Hnatek, Eugene R.

 
9780442006433: Digital Integrated Circuit Testing from a Quality Perspective (Electrical Engineering)
Hardcover
ISBN 10: 0442006438 ISBN 13: 9780442006433
Publisher: Kluwer Academic Publishers, 1993

Synopsis

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

"synopsis" may belong to another edition of this title.

Synopsis

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from an inspection mentality to using testing as a step

"About this title" may belong to another edition of this title.

Publisher
Kluwer Academic Publishers
Publication date
1993
Language
English
ISBN 10 
0442006438
ISBN 13 
9780442006433
Binding
Hardcover
Number of pages
190