Digital Integrated Circuit Testing from a Quality Perspective

Language: English

Published by Springer US, Springer Aug 1993, 1993

0442006438 / 9780442006433

  • Hardcover
  • New
See all details

Seller: Rheinberg-Buch Andreas Meier eK, Bergisch Gladbach, GermanyRheinberg-Buch Andreas Meier eK

5-star seller

AbeBooks seller since November 17, 2008

Hardcover

Condition: New

£ 93.26

£ 19.47 shipping 
Ships from Germany to U.S.A.

Quantity: 1 available

Add to basket
Free 30-day returns

Item description from seller

This item is printed on demand - it takes 3-4 days longer - Neuware -Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a 194 pp. Englisch.

Seller Inventory # 9780442006433

Title
Digital Integrated Circuit Testing from a Quality Perspective
Author
Eugene R. Hnatek
Publisher
Springer US, Springer Aug 1993
Publication year
1993
Condition
Neu
Binding
Buch
Language
English
ISBN 10
0442006438
ISBN 13
9780442006433
Item weight
462 grams
Dimensions
241x160x16 mm

Rheinberg-Buch Andreas Meier eK

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since November 17, 2008

Shipping rates from Germany to U.S.A.

Item5 to 15 business days2 to 4 business days
First item£ 19.47£ 30.46
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Paypal

Store description

Online Buchhandel

Seller's business information

Rheinberg-Buch Andreas Meier eK

Germany