Defect Oriented Testing Nano Metric Cmos by Sachdev Manoj (19 results)
Language: English
Published by New Age International Publisher, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
- International Edition
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contact seller5-star sellerInternational EditionCondition: New
£ 22.19
Free ShippingShips within U.S.A.Quantity: 2 available
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be print…ed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
Language: English
Published by New Age International Publisher, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: SMASS Sellers, IRVING, TX, U.S.A.SMASS Sellers
Contact seller4-star sellerCondition: New
£ 22.96
Free ShippingShips within U.S.A.Quantity: 2 available
Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Solr Books, Lincolnwood, IL, U.S.A.Solr Books
Contact seller4-star sellerCondition: Used - Very good
£ 57.45
£ 5.94 shippingShips within U.S.A.Quantity: 1 available
Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 143.96
£ 2.97 shippingShips within U.S.A.Quantity: 1 available
Condition: New. pp. 352 2nd Edition.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 137.84
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 151.13
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: New. pp. 352 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 189.04
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
Language: English
Published by Springer US, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
Contact seller5-star sellerCondition: Used - Fine
£ 143.46
£ 89.24 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 352 | Sprache: Englisch | Produktart: Bücher | Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrat…ed circuits have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of the highest possible quality. Testing in general and defect-oriented testing in particular help in realizing these objectives. For contemporary System on Chip (SoC) VLSI circuits, testing is an activity associated with every level of integration. However, special emphasis is placed for wafer-level test, and final test. Wafer-level test consists primarily of dc or slow-speed tests with current/voltage checks per pin under most operating conditions and with test limits properly adjusted. Basic digital tests are applied and in some cases low-frequency tests to ensure analog/RF functionality are exercised as well. Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc. This partitioning choice is actually application dependent.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 187.34
£ 53.27 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits ha…ve been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of the highest possible quality. Testing in general and defect-oriented testing in particular help in realizing these objectives. For contemporary System on Chip (SoC) VLSI circuits, testing is an activity associated with every level of integration. However, special emphasis is placed for wafer-level test, and final test. Wafer-level test consists primarily of dc or slow-speed tests with current/voltage checks per pin under most operating conditions and with test limits properly adjusted. Basic digital tests are applied and in some cases low-frequency tests to ensure analog/RF functionality are exercised as well. Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc. This partitioning choice is actually application dependent.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 187.34
£ 53.95 shippingShips from Germany to U.S.A.Quantity: 1 available
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits have been… found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of the highest possible quality. Testing in general and defect-oriented testing in particular help in realizing these objectives. For contemporary System on Chip (SoC) VLSI circuits, testing is an activity associated with every level of integration. However, special emphasis is placed for wafer-level test, and final test. Wafer-level test consists primarily of dc or slow-speed tests with current/voltage checks per pin under most operating conditions and with test limits properly adjusted. Basic digital tests are applied and in some cases low-frequency tests to ensure analog/RF functionality are exercised as well. Final test consists of checking device functionality by exercising RF tests and by applying a comprehensive suite of digital test methods such as I , delay fault testing, DDQ stuck-at testing, low-voltage testing, etc. This partitioning choice is actually application dependent.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 252.25
£ 12.50 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Paperback. Condition: Brand New. 2nd edition. 349 pages. 9.10x6.10x0.90 inches. In Stock.
Language: English
Published by Springer Verlag, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 254.44
£ 12.50 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Hardcover. Condition: Brand New. 2nd edition. 328 pages. 9.25x6.25x0.75 inches. In Stock.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
£ 280.00
£ 25.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Language: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
Contact seller5-star sellerCondition: New
£ 145.58
£ 5.78 shippingShips from Italy to U.S.A.Quantity: Over 20 available
Condition: new. Questo è un articolo print on demand.
Language: English
Published by Springer US, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 157.64
£ 41.64 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New ch…a.
Language: English
Published by Springer US, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 157.64
£ 41.64 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New ch…a.
More imagesLanguage: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
£ 163.44
£ 59.50 shippingShips from Germany to U.S.A.Quantity: 5 available
Buch. Condition: Neu. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | Manoj Sachdev (u. a.) | Buch | Frontiers in Electronic Testing | xxi | Englisch | 2007 | Springer | EAN 9780387465463 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[…dot]com | Anbieter: preigu Print on Demand.
More imagesLanguage: English
Published by Springer, 2010
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Softcover
- Print on Demand
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
£ 163.44
£ 59.50 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits | Manoj Sachdev (u. a.) | Taschenbuch | Frontiers in Electronic Testing | xxi | Englisch | 2010 | Springer | EAN 9781441942852 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartman…n[at]springer[dot]com | Anbieter: preigu Print on Demand.
Language: English
Published by Springer, 2007
Series: Frontiers in Electronic Testing, Book 18 of 40. Book 18 of 40 - Frontiers in Electronic Testing
- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 266.36
£ 8.46 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New. PRINT ON DEMAND pp. 352.
