Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Language: English

Published by Springer US, 2010

1441942858 / 9781441942852

Series: Book 18 of 40 - Frontiers in Electronic Testing

  • Softcover
  • New
See all details

Seller: moluna, Greven, Germanymoluna

5-star seller

AbeBooks seller since July 9, 2020

View this seller's items
Softcover

Condition: New

£ 159.25

£ 42.06 shipping 
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket
Free 30-day returns

Item description from seller

Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.

Seller Inventory # 4174637

Title
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Author
Manoj Sachdev|José Pineda de Gyvez
Publisher
Springer US
Publication year
2010
Condition
New
Binding
Soft cover
Language
English
ISBN 10
1441942858
ISBN 13
9781441942852
Series
Book 18 of 40: Frontiers in Electronic Testing

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item16 to 45 business days16 to 45 business days
First item£ 42.06£ 42.06
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Check
  • Paypal

Store description

Online Handel nur mit Neubüchern

Seller's business information

Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268