Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Book 18 of 40: Frontiers in Electronic Testing

Manoj Sachdev|José Pineda de Gyvez

ISBN 10: 1441942858 ISBN 13: 9781441942852
Published by Springer US, 2010
Language: English
Condition: New Soft cover

Sold by moluna, Greven, Germany

AbeBooks Seller since 9 July 2020

Seller rating 4 out of 5 stars 4-star rating, Learn more about seller ratings

View this seller's items


New - Soft cover

Condition: New

Price:
£ 162.32
£ 42.88 shipping
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket