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Characterization High Materials Devices (46 results)
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1200grams, ISBN:9780521554909.
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability (Synthesis Lectures on Solid State Materials and Devices)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 28.86
£ 11.98 shipping
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Add to basketCondition: New. In English.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback or Softback)
Language: English
Published by Cambridge University Press 11/23/2006, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Paperback or Softback. Condition: New. Characterization of High Tc Materials and Devices by Electron Microscopy. Book.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: As New. Unread book in perfect condition.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 49.79
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press 2006-11-23, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
£ 48.97
£ 15.49 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback. Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Characterization Of High Tc Materials And Devices By Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Characterization Of High Tc Materials And Devices By Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . .
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Characterization Of High Tc Materials And Devices By Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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CHARACTERIZATION OF HIGH TC MATERIALS AND DEVICES BY ELECTRON MICROSCOPY
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Hf-BASED HIGH-k DIELECTRICS: Process Development, Performance Characterization, and Reliability (Synthesis Lectures on Solid State Materials and Devices)
Language: English
Published by Morgan and Claypool Publishers, 2005
ISBN 10: 1598290045 ISBN 13: 9781598290042
Paperback. Condition: New.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen. Num Pages: 408 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 650. . 2006. Illustrated. paperback. . . . . Books ship from the US and Ireland.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2006
ISBN 10: 0521031702 ISBN 13: 9780521031707
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2015
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 406 | Sprache: Englisch | Produktart: Bücher | A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.
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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (River Publishers Series in Electronic Materials and Devices)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 116.46
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Condition: New.
-
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 150.14
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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International EditionHardcover. Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-12 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Characterization of High Tc Materials and Devices by Electron Microscopy
Language: English
Published by Cambridge University Press, 2000
ISBN 10: 052155490X ISBN 13: 9780521554909
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. A comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors. Editor(s): Browning, Nigel D.; Pennycook, Stephen J. Num Pages: 406 pages, 267 b/w illus. 3 tables. BIC Classification: PHFC; PHK; TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 24. Weight in Grams: 1125. . 2000. Illustrated. hardcover. . . . .
