Atomic Force Microscopy Scanning by Kaupp Gerd (30 results)

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  • Language: English

    Published by Berlin, Springer., 2006

    3540284052 / 9783540284055

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    239 Fig., 7 Tabl., XII, 292 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. NanoScience and Technology. Sprache: Englisch.…

  • Language: English

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    3642066631 / 9783642066634

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

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  • Language: English

    Published by Springer, 2010

    3642066631 / 9783642066634

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  • Language: English

    Published by Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2010

    3642066631 / 9783642066634

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    Paperback. Condition: New. 1st ed. Softcover of orig. ed. 2006. Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.…

  • Language: English

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    Taschenbuch. Condition: Neu. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching | Application to Rough and Natural Surfaces | Gerd Kaupp | Taschenbuch | NanoScience and Technology | xii | Englisch | 2010 | Springer | EAN 9783642066634 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

  • Language: English

    Published by Springer Berlin Heidelberg, 2010

    3642066631 / 9783642066634

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    Condition: New. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.

  • Language: English

    Published by Springer, 2006

    3540284052 / 9783540284055

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    Condition: New. In English.

  • Language: English

    Published by Springer, Berlin, Springer, 2006

    3540284052 / 9783540284055

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    Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.…

  • Language: English

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    3642066631 / 9783642066634

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.…

  • Language: English

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    Condition: New. pp. 308.

  • Language: English

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    Language: English

    Published by Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2010

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    Paperback. Condition: New. 1st ed. Softcover of orig. ed. 2006. Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.…

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    Paperback. Condition: Brand New. 304 pages. 9.25x6.10x0.70 inches. In Stock.

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  • Language: English

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  • Language: English

    Published by Springer Berlin Heidelberg, 2006

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    Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.…

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    Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 292 pp. Englisch.…

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    Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Feb 2010, 2010

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 308 pp. Englisch.…

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    Paperback. Condition: Brand New. 304 pages. 9.25x6.10x0.70 inches. In Stock. This item is printed on demand.

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    Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 308 pp. Englisch.…

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    Condition: New. Print on Demand pp. 308 239 Illus.

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  • Language: English

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