Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (Nanoscience and Technology)

Language: English

Published by Springer, 2006

3642066631 / 9783642066634

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Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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Softcover

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304 pages. 9.25x6.10x0.70 inches. In Stock.

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Title
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (Nanoscience and Technology)
Author
Gerd Kaupp
Publisher
Springer
Publication year
2006
Condition
Brand New
Binding
Paperback
Language
English
ISBN 10
3642066631
ISBN 13
9783642066634
Item weight
0.47 kilograms

Revaluation Books

Exeter, United Kingdom

5-star seller

AbeBooks seller since January 6, 2003

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Edward Bowditch Ltd

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Exeter, United Kingdom EX3 0PP