Voigtlaender Bert (58 results)

Condition: New.

HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. In English.

Condition: New. In English.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. In English.

Hardback. Condition: New. Second Edition 2019. This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.…

Condition: New.

Condition: New. Offers a full color pedagogic approach to atomic force microscopyPresents the fundamentals of the technique in detailDiscusses related technical aspects in depthProf. Dr. rer. nat. Bert Voigtlaender studied Physics at the Univ.

Condition: As New. Unread book in perfect condition.

Condition: New.

Condition: New.

Taschenbuch. Condition: Neu. Atomic Force Microscopy | Bert Voigtländer | Taschenbuch | xiv | Englisch | 2020 | Springer | EAN 9783030136567 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Condition: New.

Condition: New.

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to 'Scanning Probe Microscopy' (Springer, 2015)represents a substantial extension andrevision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner.Whileprimarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this bookis also usefulfor professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.…

Condition: New. pp. 331.

Taschenbuch. Condition: Neu. Scanning Probe Microscopy | Atomic Force Microscopy and Scanning Tunneling Microscopy | Bert Voigtländer | Taschenbuch | NanoScience and Technology | xv | Englisch | 2016 | Springer | EAN 9783662505571 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Condition: New.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.…

Hardback. Condition: New. Second Edition 2019. This book explains the operating principles of atomic force microscopy with the aim of enabling the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. This enhanced second edition to "Scanning Probe Microscopy" (Springer, 2015) represents a substantial extension and revision to the part on atomic force microscopy of the previous book. Covering both fundamental and important technical aspects of atomic force microscopy, this book concentrates on the principles the methods using a didactic approach in an easily digestible manner. While primarily aimed at graduate students in physics, materials science, chemistry, nanoscience and engineering, this book is also useful for professionals and newcomers in the field, and is an ideal reference book in any atomic force microscopy lab.…

Paperback. Condition: Brand New. 2nd edition. 348 pages. 9.25x6.10x0.82 inches. In Stock.

Hardcover. Condition: Brand New. 2nd ed. 2019 edition. 348 pages. 9.25x6.10x0.94 inches. In Stock.

Condition: New. pp. 382.

Condition: New. 400.