Taeho Kim (39 results)

Seller: BooksRun, Philadelphia, PA, U.S.A.BooksRun
Contact seller5-star sellerCondition: Used - Very good
£ 6.81
Free ShippingShips within U.S.A.Quantity: 1 available
Misc. Supplies. Condition: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Language: English
Published by Stockholm International Peace Research Instit 1996
- Softcover
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.ThriftBooks-Dallas
Contact seller5-star sellerCondition: Used - As new
£ 12.35
Free ShippingShips within U.S.A.Quantity: 1 available
Paperback. Condition: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.

Combat Identification Modeling Using Robust Optimization Techniques
Kim, Senior China Analyst In The Policy Planning Directorate Taeho
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 14.75
£ 1.97 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.

- Softcover
Seller: BargainBookStores, Grand Rapids, MI, U.S.A.BargainBookStores
Contact seller5-star sellerCondition: New
£ 16.78
Free ShippingShips within U.S.A.Quantity: 5 available
Paperback or Softback. Condition: New. Combat Identification Modeling Using Robust Optimization Techniques. Book.

Combat Identification Modeling Using Robust Optimization Techniques
Kim, Senior China Analyst In The Policy Planning Directorate Taeho
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 16.34
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.

Combat Identification Modeling Using Robust Optimization Techniques
Kim, Senior China Analyst In The Policy Planning Directorate Taeho
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 16.21
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.

- Softcover
Seller: NEPO UG, Rüsselsheim am Main, , GermanyNEPO UG
Contact seller5-star sellerCondition: Used - Very good
£ 22.56
£ 20.71 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Gut. 384 Seiten ex Library Book aus einer wissenschaftlichen Bibliothek Sprache: Englisch Gewicht in Gramm: 469.

- Softcover
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
£ 21.67
£ 42.27 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. KlappentextrnrnThe purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices.

Language: English
Published by British Library, Historical Print Editions 2012
- Softcover
- Print on Demand
Seller: PBShop.store US, Wood Dale, IL, U.S.A.PBShop.store US
Contact seller5-star sellerCondition: New
£ 17.80
Free ShippingShips within U.S.A.Quantity: Over 20 available
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Language: English
Published by British Library, Historical Print Editions Nov 2012 2012
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
£ 25.64
£ 52.60 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. Neuware - The purposes of this research were: (1) the modeling of a CID situation and (2) the search for robust and controllable input variable settings. The inputs were defined as controllable and noise variables and the confusion matrices in ROC theory were adapted to act as controllable factors. I…n this research a simple virtual battlespace representation is employed. The experimental results of the CID system are summarized by a posterior confusion matrix and throughout the confusion matrix analysis we can obtain all various types of data such as accuracy, error cost, error rates, and so forth. To find the optimal parameters three evaluation techniques were applied: (1) Linearly constrained discrete optimization, (2) Taguchi's SN ratio method and (3) Robust parameter design with a combined array. The results are compared and contrasted across different objective functions.

Engineering Mathematics with MATLAB
Yang, Won Y.; Choi, Young K.; Kim, Jaekwon; Kim, Man Cheol; Kim, H. Jin; Im, Taeho
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contact seller5-star sellerCondition: New
£ 91.15
Free ShippingShips within U.S.A.Quantity: 2 available
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

- Softcover
Seller: Revaluation Books, Exeter, , United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 79.31
£ 10.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 1st edition. 176 pages. 8.75x5.50x0.75 inches. In Stock.

- Hardcover
Seller: Phatpocket Limited, Waltham Abbey, HERTS, United KingdomPhatpocket Limited
Contact seller5-star sellerCondition: Used - Good
£ 88.95
£ 10.64 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.

Language: English
Published by British Library, Historical Print Editions 2012
- Softcover
- Print on Demand
Seller: PBShop.store UK, Fairford, GLOS, United KingdomPBShop.store UK
Contact seller5-star sellerCondition: New
£ 16.22
£ 4.16 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.

Combat Identification Modeling Using Robust Optimization Techniques
Kim, Senior China Analyst In The Policy Planning Directorate Taeho
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 92.99
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

ENGINEERING MATHEMATICS WITH MATLAB
Yang, Won Y.; Choi, Young K.; Kim, Jaekwon; Kim, Man Cheol; Kim, H. Jin; Im, Taeho
- Hardcover
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 104.89
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 4 available
Condition: New.

- Hardcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
Contact seller5-star sellerCondition: New
£ 107.71
£ 5.18 shippingShips within U.S.A.Quantity: 1 available
hardcover. Condition: New. In shrink wrap. Looks like an interesting title.

- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
Contact seller4-star sellerCondition: Used - As new
£ 85.00
£ 25.00 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Like New. Like New. book.

ENGINEERING MATHEMATICS WITH MATLAB
Yang, Won Y.; Choi, Young K.; Kim, Jaekwon; Kim, Man Cheol; Kim, H. Jin; Im, Taeho
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 110.99
£ 2.97 shippingShips within U.S.A.Quantity: 4 available
Condition: New.

Electronic Circuits with MATLAB, PSpice, and Smith Chart
Yang, Won Y.; Kim, Jaekwon; Park, Kyung W.; Baek, Donghyun; Lim, Sungjoon; Joung, Jingon; Park, Suhyun; Lee, Han L.; Choi, Woo June; Im, Taeho
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 99.67
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.

Combat Identification Modeling Using Robust Optimization Techniques
Kim, Senior China Analyst In The Policy Planning Directorate Taeho
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 113.43
£ 1.97 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.

ENGINEERING MATHEMATICS WITH MATLAB
Yang, Won Y.; Choi, Young K.; Kim, Jaekwon; Kim, Man Cheol; Kim, H. Jin; Im, Taeho
- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: New
£ 109.48
£ 8.59 shippingShips from Germany to U.S.A.Quantity: 4 available
Condition: New.

- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 137.84
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
£ 137.84
£ 11.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.

Applied Numerical Methods Using MATLAB
Yang, Won Y.; Cao, Wenwu; Kim, Jaekwon; Park, Kyung W.; Park, Ho-Hyun; Joung, Jingon; Ro, Jong-Suk; Lee, Han L.; Hong, Cheol-Ho; Im, Taeho
- Hardcover
Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
Contact seller4-star sellerCondition: New
£ 157.05
£ 6.50 shippingShips from United Kingdom to U.S.A.Quantity: 3 available
Condition: New.

- Hardcover
Seller: moluna, Greven, , Germanymoluna
Contact seller5-star sellerCondition: New
£ 121.01
£ 42.27 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Gebunden. Condition: New.

Applied Numerical Methods Using MATLAB
Yang, Won Y.; Cao, Wenwu; Kim, Jaekwon; Park, Kyung W.; Park, Ho-Hyun; Joung, Jingon; Ro, Jong-Suk; Lee, Han L.; Hong, Cheol-Ho; Im, Taeho
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 171.27
£ 2.97 shippingShips within U.S.A.Quantity: 3 available
Condition: New.

- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 172.17
£ 2.97 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 424.

- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: New
£ 183.15
£ 2.97 shippingShips within U.S.A.Quantity: 4 available
Condition: New. pp. 428.

- Hardcover
Seller: Buchpark, Trebbin, , GermanyBuchpark
Contact seller5-star sellerCondition: Used - Fine
£ 109.03
£ 90.60 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 428 | Sprache: Englisch | Produktart: Bücher | The international market is very competitive for high-tech manufacturers to day. Achieving competitive quality and reliability for products requires leader ship from the top, good management practices, effective and efficient operat…ion and maintenance systems, and use of appropriate up-to-date engineering de sign tools and methods. Furthermore, manufacturing yield and reliability are interrelated. Manufacturing yield depends on the number of defects found dur ing both the manufacturing process and the warranty period, which in turn determines the reliability. the production of microelectronics has evolved into Since the early 1970's, one of the world's largest manufacturing industries. As a result, an important agenda is the study of reliability issues in fabricating microelectronic products and consequently the systems that employ these products, particularly, the new generation of microelectronics. Such an agenda should include: ¿ the economic impact of employing the microelectronics fabricated by in dustry, ¿ a study of the relationship between reliability and yield, ¿ the progression toward miniaturization and higher reliability, and ¿ the correctness and complexity of new system designs, which include a very significant portion of software.