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Sudeb Dasgupta Brajesh Kumar Kaushik (32 results)
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Condition: New. pp. 154.
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£ 68.82
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paperback. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
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paperback. Condition: Very Good. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 â" July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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£ 71.34
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£ 61.35
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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£ 94.13
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Paperback. Condition: New.
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£ 91.12
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Spacer Engineered FinFET Architectures High-Performance Digital Circuit Applications
Published by Taylor & Francis Group, 2017
ISBN 10: 1498783597 ISBN 13: 9781498783590
Language: English
£ 105
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Spacer Engineered FinFET Architectures High-Performance Digital Circuit Applications
Published by Taylor & Francis Group, 2017
ISBN 10: 1498783597 ISBN 13: 9781498783590
Language: English
Condition: New.
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VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Published by Springer Nature Singapore, Springer Nature Singapore, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Language: English
£ 101.46
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
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£ 110.52
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£ 112.27
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£ 106.64
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Spacer Engineered FinFET Architectures High-Performance Digital Circuit Applications
Published by Taylor & Francis Group, 2017
ISBN 10: 1498783597 ISBN 13: 9781498783590
Language: English
£ 115.10
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VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 July 2, 2017, Revised Selected Papers
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
£ 119.61
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VLSI Design and Test
Published by Springer Nature Singapore, Springer Nature Singapore Dez 2017, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
£ 95.69
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Add to basketTaschenbuch. Condition: Neu. Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 840 pp. Englisch.
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VLSI Design and Test (Paperback)
Published by Springer Verlag, Singapore, Singapore, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Language: English
First Edition
£ 103.98
Convert currency£ 37.26 shipping from U.S.A. to United KingdomQuantity: 1 available
Add to basketPaperback. Condition: new. Paperback. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Vlsi Design and Test: 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers
Published by Springer-Verlag New York Inc, 2018
ISBN 10: 9811074690 ISBN 13: 9789811074691
Language: English
Paperback. Condition: Brand New. revised edition. 840 pages. 9.25x6.10x1.73 inches. In Stock.
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£ 90.11
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£ 145.50
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Add to basketCondition: New. 2017. Paperback. . . . . . Books ship from the US and Ireland.
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Paperback. Condition: New. New. book.
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paperback. Condition: New. New. book.
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Hardcover. Condition: Brand New. 138 pages. 9.50x6.50x0.55 inches. In Stock.
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VLSI Design and Test (Paperback)
Published by Springer Verlag, Singapore, Singapore, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Language: English
First Edition
£ 182.87
Convert currency£ 27.57 shipping from Australia to United KingdomQuantity: 1 available
Add to basketPaperback. Condition: new. Paperback. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Hardcover. Condition: New. New. book.
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£ 82.53
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Add to basketKartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and .
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VLSI Design and Test
Published by Springer Nature Singapore Dez 2017, 2017
ISBN 10: 9811074690 ISBN 13: 9789811074691
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
£ 95.69
Convert currency£ 9.55 shipping from Germany to United KingdomQuantity: 2 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. 840 pp. Englisch.
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Condition: New. Print on Demand.
