Items related to VLSI Design and Test: 21st International Symposium,...
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711) - Softcover
Synopsis
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.
"synopsis" may belong to another edition of this title.
Search results for VLSI Design and Test: 21st International Symposium,...
Stock Image
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 â" July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
Seller: AwesomeBooks, Wallingford, United Kingdom
Seller rating 5 out of 5 stars
paperback. Condition: Very Good. VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 â" July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. . Seller Inventory # 7719-9789811074691
Quantity: 1 available
Stock Image
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science, 711)
Seller: Bahamut Media, Reading, United Kingdom
Seller rating 5 out of 5 stars
paperback. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee. Seller Inventory # 6545-9789811074691
Quantity: 1 available
Stock Image
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9789811074691_new
Quantity: Over 20 available
Stock Image
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science)
Seller: Chiron Media, Wallingford, United Kingdom
Seller rating 4 out of 5 stars
Paperback. Condition: New. Seller Inventory # 6666-IUK-9789811074691
Quantity: 10 available
Seller Image
VLSI Design and Test
Published by
Springer Singapore, 2017
ISBN 10: 9811074690
ISBN 13: 9789811074691
New
Kartoniert / Broschiert
Seller: moluna, Greven, Germany
Seller rating 4 out of 5 stars
Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and . Seller Inventory # 178843978
Quantity: Over 20 available
Seller Image
VLSI Design and Test
Published by
Springer Nature Singapore Dez 2017, 2017
ISBN 10: 9811074690
ISBN 13: 9789811074691
New
Taschenbuch
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. 840 pp. Englisch. Seller Inventory # 9789811074691
Quantity: 2 available
Seller Image
Vlsi Design and Test : 21st International Symposium, Vdat 2017, Roorkee, India, June 29-july 2, 2017, Revised Selected Papers
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 30456571-n
Quantity: 15 available
Seller Image
VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers
Published by
Springer Nature Singapore, Springer Nature Singapore, 2017
ISBN 10: 9811074690
ISBN 13: 9789811074691
New
Taschenbuch
Seller: AHA-BUCH GmbH, Einbeck, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification. Seller Inventory # 9789811074691
Quantity: 1 available
Stock Image
VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers (Communications in Computer and Information Science, 711)
Seller: California Books, Miami, FL, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # I-9789811074691
Quantity: Over 20 available
Stock Image
VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers
Seller: Books Puddle, New York, NY, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. Seller Inventory # 26376466852
Quantity: 4 available