Title: VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 ? July 2, 2017, Revised Selected Papers
Publisher: Springer
Publication Date: 2017
Language: English
ISBN 10: 9811074690
ISBN 13: 9789811074691
Binding: Soft cover
Condition: New

About this title

Synopsis

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.
The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

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