Oechsner H (27 results)
Language: English
Published by Cham, Springer International Publishing. 2021
Series: Advanced Structured Materials, Book 140 of 150. Book 140 of 150 - Advanced Structured Materials
- Hardcover
- First Edition
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, , GermanyUniversitätsbuchhandlung Herta Hold GmbH
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1st ed. 2021. XVII, 369 p. Hardcover. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Advanced Structured Materials, 148. Sprache: Englisch.
- Hardcover
Seller: Recycle Bookstore, San Jose, CA, U.S.A.Recycle Bookstore
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Hardcover. Condition: Near Fine. This book has very minor shelfwear to the edges and corners of the covers and a very gentle overall aging to the pages, otherwise this book is in excellent, like new condition with crisp, unmarked pages, a tight binding, and a strong, clean cover.
- Hardcover
Seller: Gebrauchtbücherlogistik H.J. Lauterbach, Gummersbach, NRW, GermanyGebrauchtbücherlogistik H.J. Lauterbach
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Hardcover. Condition: Gut. 23,5cm; 667; XVIII.; Hardcover. Sprache: Englisch, Zustand: Gut bis Sehr Gut min. gebräunt (Innen); Besitzerstempel; Einband (Außen) hat geringe Gebrauchsspuren; Außenecken sind gering bestoßen; Schutzumschlag fehlt, oder es gibt keinen; * Die Photos sind original von uns erstellt worden, u.a. erkennba…r an einem kleinen weißen Stück Papier im oberen Schnitt. Ab und an verwenden Suchmaschinen Verlagsphotos, bei den Portalen selbst, werden aber nur unsere Originalphotos gezeigt.
Language: English
Published by DGM Informationsgesellschaft?Verlag, Oberursel : 1989
- Hardcover
Seller: Gebrauchtbücherlogistik H.J. Lauterbach, Gummersbach, NRW, GermanyGebrauchtbücherlogistik H.J. Lauterbach
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Hardcover. Condition: Gut. 23,5cm; 671-1294; XVIII.; Hardcover. Sprache: Englisch, zahlreiche Abbildungen und Tabellen. Zustand: Gut bis Sehr Gut min. gebräunt (Innen); Besitzerstempel; Einband (Außen) hat geringe Gebrauchsspuren; Schutzumschlag fehlt, oder es gibt keinen; * Die Photos sind original von uns erstellt worden, u.a.… erkennbar an einem kleinen weißen Stück Papier im oberen Schnitt. Ab und an verwenden Suchmaschinen Verlagsphotos, bei den Portalen selbst, werden aber nur unsere Originalphotos gezeigt.
- Hardcover
Seller: Antiquariat Bookfarm, Löbnitz, GermanyAntiquariat Bookfarm
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Hardcover. XI, 205 p. Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05569 3540133208 Sprache: Englisch Gewicht in Gramm: 550.
- Hardcover
Seller: Antiquariat Klittich-Pfankuch GmbH + Co., Braunschweig, , GermanyAntiquariat Klittich-Pfankuch GmbH + Co.
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Oechsner, Hans. Der Bauer im Staat. Nationalsozialistische Bauernstaatskunde. Im Auftrage des Reichsbundes Deutscher Diplomlandwirte. 5. neubearbeitete Auflage. Hannover, Schaper, 1936. 8°. Mit einem Porträt und vielen Textabbildungen. 79 Seiten. Original - geheftet. * Name auf Innenumschlag. Umschlag am Rücken und den Rändern v…erblichen. Rücken oben etwas defekt.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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£ 96.88
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Condition: New. In.
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: New.
Language: English
Published by Springer 2020
Series: Advanced Structured Materials, Book 113 of 150. Book 113 of 150 - Advanced Structured Materials
- Softcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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Condition: New.
Language: English
Published by Springer 2019
Series: Advanced Structured Materials, Book 113 of 150. Book 113 of 150 - Advanced Structured Materials
- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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£ 116.51
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Condition: New.
- Softcover
Seller: moluna, Greven, , Germanymoluna
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£ 82.49
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Condition: New.
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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£ 126.76
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Condition: New. pp. 224.
- Softcover
Seller: Revaluation Books, Exeter, , United KingdomRevaluation Books
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£ 127.73
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Paperback. Condition: Brand New. reprint edition. 205 pages. 9.75x7.00x0.50 inches. In Stock.
Language: English
Published by Springer 2020
Series: Advanced Structured Materials, Book 113 of 150. Book 113 of 150 - Advanced Structured Materials
- Softcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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£ 141.05
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Condition: New.
Language: English
Published by Springer 2019
Series: Advanced Structured Materials, Book 113 of 150. Book 113 of 150 - Advanced Structured Materials
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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£ 142.47
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Condition: New.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technological applica ti…ons and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the 'Physikzentrum' in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.
- Softcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Paperback. Condition: Like New. Like New. book.
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 174.32
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Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer 2023
Series: Advanced Structured Materials, Book 149 of 150. Book 149 of 150 - Advanced Structured Materials
- Softcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
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£ 205.50
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Condition: New.
Language: English
Published by Springer 2023
Series: Advanced Structured Materials, Book 149 of 150. Book 149 of 150 - Advanced Structured Materials
- Softcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
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£ 252.55
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Condition: New.
- Hardcover
Seller: Buchpark, Trebbin, , GermanyBuchpark
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£ 649.51
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
Published by Amsterdam, Elsevier 1993. 1993
- Hardcover
Seller: Antiquariat Löcker, Wien, , AustriaAntiquariat Löcker
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4°. XII, 638 S. m. einigen s/w Abb., OPpbd., ausgeschied. Bibl.-Expl. mit den üblichen Kennzeichnungen. ISSN 0257-8972.
- Softcover
- Print on Demand
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
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Condition: new. Questo è un articolo print on demand.
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, , GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technolo…gical applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the 'Physikzentrum' in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3. 224 pp. Englisch.
- Softcover
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Seller: Majestic Books, Hounslow, , United KingdomMajestic Books
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Condition: New. Print on Demand pp. 224 99 Figures, 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
- Softcover
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Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 224.
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -The characterization of thin films and solid interfaces as well as the determina tion of concentration profiles in thin solid layers is one of the fields which re quire a rapid transfer of the results from basic research to technologica…l applica tions and developments. It is the merit of the Dr. Wilhelm Heinrich and Else Heraeus-Stiftung to promote such a transfer by organizing high standard seminars mostly held at the 'Physikzentrum' in Bad Honnef near Bonn. The present book has been stimulated by one of these seminars assembling most of the invited speakers as co-authors. The editor appreciates the cooperation of his colleagues contributing to this book. H. Oechsner Kaiserslautern, April 1984 v Contents 1. Introduction. ByH. Oechsner . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1. 1 Requirements for Thin Film and In-Depth Analysis . . . . . . . . . . . . . . . . . . . 1 1. 2 Object and Outl i ne of the Book . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 4 References 2. The Application of Beam and Diffraction Techniques to Thin Film and Surface Micro-Analysis. By H. W. Werner (With 25 Fi gures) . . . . . . . . . . . . . . . . 5 2. 1 Methods to Determine Chemical Structures in Material Research 5 2. 2 Selected Analytical Features Used to Determine Chemical Structures 9 2. 2. 1 Depth Profi 1 ing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 9 a) Destructive Depth Profiling b) Nondestructive Methods for Depth and Thin Film Analysis 15 19 2. 2. 2 Microspot Analysis and Element Imaging 2. 3 Determining Physical Structures in Material Research . . . . . . . . . . . . . . . 27 2. 3. 1 X-Ray Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27 2. 3. 2 X-Ray Double Crystal Diffraction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 2. 3.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 224 pp. Englisch.
