Thin Film and Depth Profile Analysis

Oechsner, H. (EDT); Etzkorn, H.-W. (CON); Hofer, W. O. (CON); Hofmann, S. (CON); Kempf, J. E. (CON)

ISBN 10: 3642465013 ISBN 13: 9783642465017
Published by Springer, 2012
Language: English
Condition: Used - As new Soft cover

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Used - Soft cover

Condition: Used - As new

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