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Mitch Wallis (28 results)
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Condition: New.
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Hardback or Cased Book. Condition: New. Mitch Epstein: American Nature. Book.
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Condition: As New. Unread book in perfect condition.
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Mitch Epstein : American Nature
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: Very Good.
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Mitch Epstein : American Nature
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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hardcover. Condition: New. Special order direct from the distributor.
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Hardcover. Condition: Brand New. 160 pages. 11.25x9.75x0.75 inches. In Stock.
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Hardcover. Condition: Brand New. 160 pages. 11.25x9.75x0.75 inches. In Stock.
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Hardcover. Condition: Brand New. 160 pages. 11.25x9.75x0.75 inches. In Stock.
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Condition: NEW.
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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Seller: Prior Books Ltd, Cheltenham, United Kingdom
Association Member: ABA ILAB PBFA
Seller rating 5 out of 5 stars
First Edition
Hardcover. Condition: Like New. First Edition. A firm and square hardback with strong joints, and sharp corners just showing a few very minor cosmetic rubs. Hence a non-text page has a small 'damaged' stamp. Despite such this book is actually in nearly new condition. Thus the contents are crisp, fresh and tight. Also, no pen-marks and not from a library so no such stamps or labels. Now offered for sale at a very sensible price.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press CUP, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. pp. 320.
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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. pp. 320.
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MEASUREMENT TECHNIQUES FOR RADIO FREQUENCY NANOELECTRONICS
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: Used. pp. 320.
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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Hardcover. Condition: New. New. book.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: As New. Unread book in perfect condition.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New.
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Measurement Techniques for Radio Frequency Nanoelectronics (Hardcover)
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, Cambridge, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Hardcover. Condition: new. Hardcover. Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics. Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Hardcover. Condition: Brand New. 320 pages. 10.00x7.00x0.75 inches. In Stock.
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Hardcover. Condition: Brand New. 320 pages. 10.00x7.00x0.75 inches. In Stock. This item is printed on demand.
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Measurement Techniques for Radio Frequency Nanoelectronics
Book 15 of 20: Cambridge RF and Microwave EngineeringLanguage: English
Published by Cambridge University Press, 2017
ISBN 10: 1107120683 ISBN 13: 9781107120686
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in.
