Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series) - Hardcover

Book 15 of 20: Cambridge RF and Microwave Engineering

Wallis, T. Mitch; Kabos, Pavel

 
9781107120686: Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
Hardcover
ISBN 10: 1107120683 ISBN 13: 9781107120686
Publisher: Cambridge University Press, 2017

Synopsis

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.

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About the Authors

T. Mitch Wallis is a physicist in the Applied Physics Division at the National Institute of Standards and Technology, Boulder, Colorado. He is also the Chair of the Institute of Electrical and Electronics Engineers (IEEE) Microwave Theory and Techniques Society's Technical Committee on Radio Frequency Nanotechnology.

Pavel Kabos is a physicist in the Applied Physics Division at the National Institute of Standards and Technology. He is the author of Magnetostatic Waves and Their Applications (1993) and a Fellow of the Institute of Electrical and Electronics Engineers (IEEE).

"About this title" may belong to another edition of this title.

Publisher
Cambridge University Press
Publication date
2017
Language
English
ISBN 10 
1107120683
ISBN 13 
9781107120686
Binding
Hardcover
Number of pages
328