He Feifei (14 results)

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    Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover

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    Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

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  • Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover

    Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections

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    Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover

    Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

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  • Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover

    Seller: Books Puddle, New York, NY, U.S.A.Books Puddle

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    Condition: New. pp. 116.

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    Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover

    Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK

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    Language: English

    Published by Albert Whitman & Company, 2019

    • Hardcover
    • Signed

    Seller: Barely Read Books, Limpsfield, United KingdomBarely Read Books

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    Condition: Used - Fine

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    Hardcover. Condition: Fine. Dust Jacket Condition: Fine. reprint. Very clean bright boards no bumps or rubs. Textblocks in red, Book plate with author signature to FEP unopened. Fine.   Dust Wrapper Complete no loss tears or rubs as new. Jacket Illustration by Feifei Ruan Design and Interior Illustrations by Ellen Kokontis (illu

  • Language: English

    Published by Springer Verlag, 2013

    9814451207 / 9789814451208

    • Softcover

    Seller: Revaluation Books, Exeter, United KingdomRevaluation Books

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    Paperback. Condition: Brand New. 2013 edition. 112 pages. 9.37x6.14x0.39 inches. In Stock.

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    Language: English

    Published by Springer Nature Singapore, Springer, 2013

    9814451207 / 9789814451208

    • Softcover

    Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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    Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect

  • Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover
    • Print on Demand

    Seller: Basi6 International, Irving, TX, U.S.A.Basi6 International

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    Condition: Brand New. New. US edition. Print on demand title. Delivery takes 20-25 days. Excellent Customer Service.

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    Language: English

    Published by Springer Nature Singapore Mai 2013, 2013

    9814451207 / 9789814451208

    • Softcover
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    Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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    Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number

  • Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover
    • Print on Demand

    Seller: Majestic Books, Hounslow, United KingdomMajestic Books

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    Condition: New. Print on Demand pp. 116 75 Illus. (2 Col.).

  • Language: English

    Published by Springer, 2013

    9814451207 / 9789814451208

    • Softcover
    • Print on Demand

    Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios

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    Condition: New. PRINT ON DEMAND pp. 116.

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    Language: English

    Published by Springer Nature Singapore, 2013

    9814451207 / 9789814451208

    • Softcover
    • Print on Demand

    Seller: moluna, Greven, Germanymoluna

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    Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Highlights a new method which models the interconnects EM reliability in both 3D and circuit layout level Combines Cadence and ANSYS softwares to model interconnect reliability of real 3D circuit made up of complete i