Order Total (1 Item Items):
Shipping Destination:
Diebold Alain (69 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (69)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (44)
- As New, Fine or Near Fine (9)
- Very Good or Good (11)
- Fair or Poor (5)
- As Described (No further results match this refinement)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (4)
- Seller-Supplied Images (18)
- Not Print on Demand (51)
Language (2)
Free Shipping
Seller Location
Seller Rating
-
Gartensituationen: Inspirationen für jeden Gartenbereich
Language: German
Published by Callwey Georg D.W. GmbH, 2015
ISBN 10: 3766721380 ISBN 13: 9783766721389
Condition: good. Befriedigend/Good: Durchschnittlich erhaltenes Buch bzw. Schutzumschlag mit Gebrauchsspuren, aber vollständigen Seiten. / Describes the average WORN book or dust jacket that has all the pages present.
-
Gartensituationen: Inspirationen für jeden Gartenbereich
Language: German
Published by Callwey Georg D.W. GmbH, 2015
ISBN 10: 3766721380 ISBN 13: 9783766721389
Condition: very good. Gut/Very good: Buch bzw. Schutzumschlag mit wenigen Gebrauchsspuren an Einband, Schutzumschlag oder Seiten. / Describes a book or dust jacket that does show some signs of wear on either the binding, dust jacket or pages.
-
Semiconductor Characterization: Present Status and Future Needs
Language: English
Published by American Institute Of Physics, 1996
ISBN 10: 1563965038 ISBN 13: 9781563965036
Condition: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,2000grams, ISBN:9781563965036.
-
gebunden. Condition: Sehr gut. Gebraucht - Sehr gut Ungelesenes, vollständiges Exemplar; in sehr gutem Zustand, leichte Lagerspuren, als Mängelexemplar gekennzeichnet -Nicht jede Pflanze eignet sich für jeden Garten und nicht an jedem Ort im Garten fühlt sie sich auch wohl. Deswegen ist eine Bestandsaufnahme vor dem Start besonders wichtig. Diese Überlegungen schließt auch die Architektur mit ein, denn der Garten solle ğim Idealfall die Architektur und den Charakter der Besitzer widerspiegeln.Ğ Alain Diebold und Silvia Schaub zeigen, wie man Vorgärten, Hausbeete, Wegumrandungen, Sitzplätze und Terrassen richtig einschätzt und standortgerecht gestaltet. Die Autoren erklären, für welche Gartensituationen man welche Pflanzen einsetzen kann und wie man richtig auf Boden und Sonnenverhältnisse reagiert. Egal wie die Voraussetzungen und Stil-Vorlieben auch sein mögen - für jede Situation gibt es eine Lösung. ğDer Garten wird so zu einem erweiterten Zimmer des Wohnraums.Ğ (Alain Diebold). 176 pp. Deutsch.
-
Handbook of Silicon Semiconductor Metrology
Seller: Books From California, Simi Valley, CA, U.S.A.
Seller rating 4 out of 5 stars
paperback. Condition: Very Good.
-
Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings, 550)
Language: English
Published by American Institute of Physics, 2001
ISBN 10: 156396967X ISBN 13: 9781563969676
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 5 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
-
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for . / Materials Physics and Applications)
Language: English
Published by American Institute of Physics (edition 2007), 2007
ISBN 10: 0735404410 ISBN 13: 9780735404410
Hardcover. Condition: Very Good. 2007. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.
-
Condition: As New. Unread book in perfect condition.
-
Condition: New.
-
Handbook of Silicon Semiconductor Metrology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
-
Handbook of Silicon Semiconductor Metrology
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
-
Condition: New.
-
Condition: New.
-
Condition: New. Alain C. DieboldContaining more than 300 equations and nearly 500 drawings, photographs, and micrographs,this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement t.
-
Paperback. Condition: Brand New. 896 pages. 10.00x7.01x2.05 inches. In Stock.
-
Optical and Electrical Properties of Nanoscale Materials (Springer Series in Materials Science, 318)
Book 2 of 233: Springer Series in Materials ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 137.84
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Optical and Electrical Properties of Nanoscale Materials (Springer Series in Materials Science, 318)
Book 2 of 233: Springer Series in Materials ScienceSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 137.84
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Optical and Electrical Properties of Nanoscale Materials (Hardcover)
Book 2 of 233: Springer Series in Materials ScienceLanguage: English
Published by Springer Nature Switzerland AG, Cham, 2022
ISBN 10: 3030803228 ISBN 13: 9783030803223
Hardcover. Condition: new. Hardcover. This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Beginning with a review of the optical and solid state physics needed for understanding optical and electrical properties, the book then introduces the electronic band structure of solids and discusses the effect of spin orbit coupling on the valence band, which is critical for understanding the optical properties of most nanoscale materials. Excitonic effects and excitons are also presented along with their effect on optical absorption.2D materials, such as graphene and transition metal dichalcogenides, are host to unique electrical properties resulting from the electronic band structure. This book devotes significant attention to the optical and electrical properties of 2D and topological materials with an emphasis on optical measurements, electrical characterization of carrier transport, and a discussion of the electronic band structures using a tight binding approach. This book succinctly compiles useful fundamental and practical information from one of the fastest growing research topics in materials science and is thus an essential compendium for both students and researchers in this rapidly moving field. This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
-
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 398 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
-
Handbook of Silicon Semiconductor Metrology
Language: English
Published by Taylor & Francis Ltd Okt 2019, 2019
ISBN 10: 0367397161 ISBN 13: 9780367397166
Taschenbuch. Condition: Neu. Neuware.
-
-
Taschenbuch. Condition: Neu. Optical and Electrical Properties of Nanoscale Materials | Alain Diebold (u. a.) | Taschenbuch | Springer Series in Materials Science | xix | Englisch | 2023 | Springer | EAN 9783030803254 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Condition: New. 1st ed. 2021 edition NO-PA16APR2015-KAP.
-
Optical And Electrical Properties Of Nan
Book 2 of 233: Springer Series in Materials ScienceSeller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
-
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Beginning with a review of the optical and solid state physics needed for understanding optical and electrical properties, the book then introduces the electronic band structure of solids and discusses the effect of spin orbit coupling on the valence band, which is critical for understanding the optical properties of most nanoscale materials. Excitonic effects and excitons are also presented along with their effect on optical absorption.2D materials, such as graphene and transition metal dichalcogenides, are host to unique electrical properties resulting from the electronic band structure. This book devotes significant attention to the optical and electrical properties of 2D and topological materials with an emphasis on optical measurements, electrical characterization of carrier transport, and a discussion of the electronic band structures using a tight binding approach. This book succinctly compiles useful fundamental and practical information from one of the fastest growing research topics in materials science and is thus an essential compendium for both students and researchers in this rapidly moving field.
-
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 578 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
-
Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for . / Materials Physics and Applications)
Language: English
Published by American Institute of Physics, 2007
ISBN 10: 0735404410 ISBN 13: 9780735404410
Hardcover. Condition: Very Good. Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Paperback. Condition: Brand New. 503 pages. 9.25x6.10x1.38 inches. In Stock.
-
Hardcover. Condition: Brand New. 484 pages. 9.75x6.50x1.25 inches. In Stock.
-
Optical and Electrical Properties of Nanoscale Materials (Hardcover)
Book 2 of 233: Springer Series in Materials ScienceLanguage: English
Published by Springer Nature Switzerland AG, Cham, 2022
ISBN 10: 3030803228 ISBN 13: 9783030803223
Hardcover. Condition: new. Hardcover. This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Beginning with a review of the optical and solid state physics needed for understanding optical and electrical properties, the book then introduces the electronic band structure of solids and discusses the effect of spin orbit coupling on the valence band, which is critical for understanding the optical properties of most nanoscale materials. Excitonic effects and excitons are also presented along with their effect on optical absorption.2D materials, such as graphene and transition metal dichalcogenides, are host to unique electrical properties resulting from the electronic band structure. This book devotes significant attention to the optical and electrical properties of 2D and topological materials with an emphasis on optical measurements, electrical characterization of carrier transport, and a discussion of the electronic band structures using a tight binding approach. This book succinctly compiles useful fundamental and practical information from one of the fastest growing research topics in materials science and is thus an essential compendium for both students and researchers in this rapidly moving field. This book covers the optical and electrical properties of nanoscale materials with an emphasis on how new and unique material properties result from the special nature of their electronic band structure. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
