Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference ... / Materials Physics and Applications) - Hardcover
Synopsis
This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics. It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.
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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for . / Materials Physics and Applications)
Published by
American Institute of Physics (edition 2007), 2007
ISBN 10: 0735404410
ISBN 13: 9780735404410
Used
Hardcover
Seller: BooksRun, Philadelphia, PA, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. 2007. It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience. Seller Inventory # 0735404410-11-1-6
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Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano
Seller: Buchpark, Trebbin, Germany
Seller rating 5 out of 5 stars
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 3966653/12