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Dennis Bley (38 results)
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: Used. pp. 396.
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Condition: Used. pp. 396 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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Condition: As New. Unread book in perfect condition.
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Condition: Used. pp. 396.
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Risk Methodologies for Technological Legacies (NATO Science Series: IV:, 18)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.80
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Risk Methodologies for Technological Legacies (NATO Science Series: IV:, 18)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
£ 50.80
£ 11.98 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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PF. Condition: New.
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Condition: New.
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Condition: New.
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Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New.
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Risk Methodologies for Technological Legacies
Language: English
Published by Kluwer Academic Publishers, 2003
ISBN 10: 1402012586 ISBN 13: 9781402012587
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 240 x 160 x 20. Weight in Grams: 630. . 2003. Softcover reprint of the original 1st ed. 2003. paperback. . . . .
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Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Condition: New. pp. 396, Maps.
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Condition: New. pp. 396.
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Risk Methodologies for Technological Legacies
Language: English
Published by Kluwer Academic Publishers, 2003
ISBN 10: 1402012578 ISBN 13: 9781402012570
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 244 x 170 x 22. Weight in Grams: 1610. . 2003. Hardback. . . . .
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Paperback. Condition: Brand New. 1st edition. 400 pages. 9.25x6.25x0.75 inches. In Stock.
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Risk Methodologies for Technological Legacies
Language: English
Published by Kluwer Academic Publishers, 2003
ISBN 10: 1402012586 ISBN 13: 9781402012587
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 240 x 160 x 20. Weight in Grams: 630. . 2003. Softcover reprint of the original 1st ed. 2003. paperback. . . . . Books ship from the US and Ireland.
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Risk Methodologies for Technological Legacies
Language: English
Published by Kluwer Academic Publishers, 2003
ISBN 10: 1402012578 ISBN 13: 9781402012570
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 244 x 170 x 22. Weight in Grams: 1610. . 2003. Hardback. . . . . Books ship from the US and Ireland.
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Risk Methodologies for Technological Legacies
Language: English
Published by Springer Netherlands, Springer Netherlands, 2003
ISBN 10: 1402012586 ISBN 13: 9781402012587
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potential accidents. Facility contamination and environmental degradation, as well as the accident vulnerable facilities and equipment, are a result of weapons development, testing, and production. Although the countries face similar issues from similar activities, important differences in waste management practices make the potential environmental and health risks of more immediate concern in the FSU and Eastern Europe. In the West, most nuclear and chemical waste is stored in known contained locations, while in the East, much of the equivalent material is unconfined, contaminating the environment. In the past decade, the U.S. started to address and remediate these Cold War legacies. Costs have been very high, and the projected cost estimates for total cleanup are still increasing. Currently in Russia, the resources for starting such major activities continue to be unavailable.
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Risk Methodologies for Technological Legacies
Language: English
Published by Springer Netherlands, Springer Netherlands, 2003
ISBN 10: 1402012578 ISBN 13: 9781402012570
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potential accidents. Facility contamination and environmental degradation, as well as the accident vulnerable facilities and equipment, are a result of weapons development, testing, and production. Although the countries face similar issues from similar activities, important differences in waste management practices make the potential environmental and health risks of more immediate concern in the FSU and Eastern Europe. In the West, most nuclear and chemical waste is stored in known contained locations, while in the East, much of the equivalent material is unconfined, contaminating the environment. In the past decade, the U.S. started to address and remediate these Cold War legacies. Costs have been very high, and the projected cost estimates for total cleanup are still increasing. Currently in Russia, the resources for starting such major activities continue to be unavailable.
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Risk Methodologies for Technological Legacies
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition.
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Hardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: New. Print on Demand pp. 396 Illus., Maps.
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Risk Methodologies for Technological Legacies
Language: English
Published by Springer-Verlag New York Inc., 2003
ISBN 10: 1402012586 ISBN 13: 9781402012587
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
£ 57.65
£ 16.59 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
