Droppo James G (14 results)
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Droppo, James G. (EDT); Eremenko, Vitaly A. (EDT); Lundgren, Regina (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 53.35
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Condition: As New. Unread book in perfect condition.
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Droppo, James G. (EDT); Eremenko, Vitaly A. (EDT); Lundgren, Regina (EDT)
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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£ 56.37
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Condition: New.
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Droppo, James G. (EDT); Eremenko, Vitaly A. (EDT); Lundgren, Regina (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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£ 50.40
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Condition: New.
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Eremenko, Vitaly A. (EDT); Droppo, James G.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
£ 70.76
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Condition: New.
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Droppo, James G. (EDT); Eremenko, Vitaly A. (EDT); Lundgren, Regina (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 56.08
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Risk Methodologies for Technological Legacies
. Ed(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G.
- Hardcover
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, IrelandKennys Bookshop and Art Galleries Ltd.
Contact seller5-star sellerCondition: New
£ 65.00
£ 7.93 shippingShips from Ireland to U.S.A.Quantity: 15 available
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 244 x 170 x 22. Weight in Grams: 1610. . 2003. Hardback. . . . . …
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Eremenko, Vitaly A. (EDT); Droppo, James G.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
£ 62.41
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
£ 68.74
£ 12.50 shippingShips from United Kingdom to U.S.A.Quantity: 2 available
Paperback. Condition: Brand New. 1st edition. 400 pages. 9.25x6.25x0.75 inches. In Stock.
Risk Methodologies for Technological Legacies
. Ed(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G.
- Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.Kennys Bookstore
Contact seller5-star sellerCondition: New
£ 82.10
£ 7.94 shippingShips within U.S.A.Quantity: 15 available
Condition: New. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 Editor(s): Bley, Dennis; Eremenko, Vitaly A.; Droppo, James G. Series: NATO Science Series IV. Num Pages: 366 pages, biography. BIC Classification: GPQD; KJMD; RN. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly; (UU) Undergraduate. Dimension: 244 x 170 x 22. Weight in Grams: 1610. . 2003. Hardback. . . . . Books ship from the US and Ireland. …
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Eremenko, Vitaly A. (EDT); Droppo, James G.
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
£ 119.99
£ 15.00 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Risk Methodologies for Technological Legacies
Bley, Dennis C. (EDT); Eremenko, Vitaly A. (EDT); Droppo, James G.
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
£ 142.51
£ 2.00 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
Language: English
Published by CRC Press 2002-10-29, 2002
Series: Book 9 of 24 - Electrical Engineering & Applied Signal Processing
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
£ 134.52
£ 6.49 shippingShips from United Kingdom to U.S.A.Quantity: 5 available
Hardcover. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 7-8 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 41.61
£ 40.91 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potentia.…
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
Contact seller5-star sellerCondition: New
£ 41.61
£ 40.91 shippingShips from Germany to U.S.A.Quantity: Over 20 available
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Bourgas, Bulgaria from 2 to 11 May 2000 The Cold War Era left the major participants, the United States and the former Soviet Union (FSU), with large legacies in terms of both contamination and potentia.…
