Deane K C (69 results)

Paperback. Condition: Very Good. The challenges public comprehensive universities face today are expanding. While these universities have a long history of adapting to change, today's environment will likely test the capabilities of even the most adaptive institutions. This volume assembles a team of experts from a variety of disciplines to examine both the history of the comprehensive university and what lies ahead.…

Paperback. Condition: Very Good. It's a well-cared-for item that has seen limited use. The item may show minor signs of wear. All the text is legible, with all pages included. It may have slight markings and/or highlighting.

Paperback. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.

Paperback. Condition: Very Good. The challenges public comprehensive universities face today are expanding. While these universities have a long history of adapting to change, today's environment will likely test the capabilities of even the most adaptive institutions. This volume assembles a team of experts from a variety of disciplines to examine both the history of the comprehensive university and what lies ahead.…

paperback. Condition: Fine.

paperback. Condition: Very Good.

Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Nov. 2 (weekend sale item)* 710 pp., hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. …

Condition: New.

HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000.

Condition: As New. Unread book in perfect condition.

Condition: new.

Condition: New.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. Editor(s): Schneider, Mark; Deane, K. C. Num Pages: 256 pages. BIC Classification: JNA; JNM. Category: (G) General (US: Trade). Dimension: 229 x 156 x 20. Weight in Grams: 499. . 2014. hardcover. . . . .

Condition: New. pp. 648.

Hardcover. Condition: Brand New. 245 pages. 9.50x6.75x0.75 inches. In Stock.

Hardback. Condition: New. New copy - Usually dispatched within 4 working days.

Condition: New. 256.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.…

Condition: New. pp. 712.

Condition: New.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index. …

Condition: New. 256.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 41st Annual Conference on Applications of X-Ray Analysis was held August 3-7, 1992, at the Sheraton Colorado Springs Hotel, Colorado Springs, Colorado. The Conference is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for further developments. In recent years, one of the most exciting and important developments in the x-ray field has been the applications of grazing-incidence x-rays for surface and thin-film analysis. To introduce the conference attendees to these 'leading-edge' developments, the topic for the Plenary Session was 'Grazing-Incidence X Ray Characterization of Materials. ' The Conference had the privilege of inviting leading experts in the field of x-ray thin film analysis to deliver lectures at the Plenary Session. Dr. D. K. Bowen, University of Warwick, U. K. , opened the session with a lecture on 'Grazing Incidence X-Ray Scattering from Thin Films. ' He reviewed and compared grazing incidence diffraction, fluorescence and reflectivity techniques. Results of experimental and theoretical analysis were also discussed. Dr. B. Lenge1er, Forchungszentrum Ju1ich, Germany, followed with a lecture on 'Grazing Incidence Diffuse X-Ray Scattering from Thin Films. ' He concentrated on the use of newly developed 'off-specular' reflectivity techniques for the determination of vertical roughness, lateral correlation length and contour exponent on surfaces.…

Condition: New. In English.

Hardback. Condition: New. The challenges public comprehensive universities face today are expanding - they have been challenged to enroll and graduate more students, adopt new technologies that lower cost without sacrificing quality, and align program and curricular offerings with the skills that employers require. While these universities have a long history of adapting to change, today's environment will likely test the capabilities of even the most adaptive institutions. This volume assembles a team of experts from a variety of disciplines to examine both the history of the comprehensive university and what lies ahead. Overall, the book grapples with such questions as: How do these institutions adapt to serve the growing population of non-traditional students? How well do they prepare graduates for the labor market? Can partnerships between community colleges and comprehensive universities bolster student success?The University Next Door draws much-needed attention to a set of institutions that has historically received little notice, yet play an important role in meeting our new attainment goals and helping the American economy grow.…

Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.…

Condition: New. Editor(s): Schneider, Mark; Deane, K. C. Num Pages: 256 pages. BIC Classification: JNA; JNM. Category: (G) General (US: Trade). Dimension: 229 x 156 x 20. Weight in Grams: 499. . 2014. hardcover. . . . . Books ship from the US and Ireland.