Seller: Books From California, Simi Valley, CA, U.S.A.
Paperback. Condition: Fine.
Language: English
Published by BIOS Scientific, Oxford, 2001
ISBN 10: 1859961347 ISBN 13: 9781859961346
Seller: Row By Row Bookshop, Sugar Grove, NC, U.S.A.
First Edition
Trade Paperback. Condition: Good. Dust Jacket Condition: No Dust Jacket. First Edition. An ex-library copy in original paper covers. The usual ex-libris markings. The binding is sound (with no spine creasing), the text is clean/unmarked, and there is little wear to the covers. Book.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
Condition: New. pp. 296 Index.
Seller: Majestic Books, Hounslow, United Kingdom
Condition: New. pp. 296.
Seller: Ria Christie Collections, Uxbridge, United Kingdom
£ 53.08
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Add to basketCondition: New. In.
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Seller: Phatpocket Limited, Waltham Abbey, HERTS, United Kingdom
Condition: Good. Your purchase helps support Sri Lankan Children's Charity 'The Rainbow Centre'. Ex-library, so some stamps and wear, but in good overall condition. Our donations to The Rainbow Centre have helped provide an education and a safe haven to hundreds of children who live in appalling conditions.
Seller: Revaluation Books, Exeter, United Kingdom
Hardcover. Condition: Brand New. 1st edition. 296 pages. 9.25x6.25x0.75 inches. In Stock.
Condition: New. Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. Thi.
Language: English
Published by John Wiley & Sons Inc, 2011
ISBN 10: 0470518510 ISBN 13: 9780470518519
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. Editor(s): Brydson, Rik. Series: Royal Microscopical Society. Num Pages: 296 pages, Illustrations. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 240 x 164 x 20. Weight in Grams: 580. . 2011. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
Language: English
Published by Taylor & Francis Ltd, 2001
ISBN 10: 1859961347 ISBN 13: 9781859961346
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Paperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
Language: English
Published by John Wiley & Sons Inc, 2011
ISBN 10: 0470518510 ISBN 13: 9780470518519
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
First Edition
Condition: New. The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. Editor(s): Brydson, Rik. Series: Royal Microscopical Society. Num Pages: 296 pages, Illustrations. BIC Classification: PDND. Category: (P) Professional & Vocational. Dimension: 240 x 164 x 20. Weight in Grams: 580. . 2011. 1st Edition. Hardcover. . . . .
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
£ 113.99
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Add to basketCondition: As New. Unread book in perfect condition.
Language: English
Published by John Wiley & Sons Sep 2011, 2011
ISBN 10: 0470518510 ISBN 13: 9780470518519
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Neuware - The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
Seller: Mispah books, Redhill, SURRE, United Kingdom
Hardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Language: English
Published by Bios Scientific Pub Ltd, 2001
ISBN 10: 1859961347 ISBN 13: 9781859961346
Seller: Revaluation Books, Exeter, United Kingdom
Paperback. Condition: Brand New. 1st edition. 160 pages. 9.00x6.25x0.50 inches. In Stock.
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
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Add to basketHRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
Language: English
Published by John Wiley & Sons Inc, 2011
ISBN 10: 0470518510 ISBN 13: 9780470518519
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
£ 61.73
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Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Language: English
Published by John Wiley & Sons Inc, New York, 2011
ISBN 10: 0470518510 ISBN 13: 9780470518519
Seller: CitiRetail, Stevenage, United Kingdom
First Edition Print on Demand
Hardcover. Condition: new. Hardcover. The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS). The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Language: English
Published by Taylor & Francis Ltd, 2001
ISBN 10: 1859961347 ISBN 13: 9781859961346
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.