Aberration-Corrected Analytical Transmission Electron Microscopy (RMS - Royal Microscopical Society) - Hardcover

Hardcover

ISBN 10: 0470518510 ISBN 13: 9780470518519

Publisher: Wiley, 2011

Synopsis

The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

About this title

About the Author

Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).

From the Back Cover

Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. This book presents the background and implementation of techniques which have allowed true imaging and chemical analysis at the scale of single atoms as applied to the fields of materials science and nanotechnology.

Edited and written by the founders of the world’s first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text:

• Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes
• Is based on an established course taught at postgraduate summer schools by leaders in this field.
• Is essential reading for researchers involved in the analysis of materials at the nanoscale

Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.

Edited and written by the founders of the world’s first aberration corrected Scanning Transmission Electron Microscope facility (SuperSTEM at Daresbury Laboratories in the UK), this text:

• Presents the theory, instrumentation and applications of aberration correction in transmission electron microscopes
• Is based on an established course taught at postgraduate summer schools by leaders in this field.
• Is essential reading for researchers involved in the analysis of materials at the nanoscale

Ideal for final-year undergraduates and postgraduate students, as well as academics and industrialists involved in electron microscopy, this book can be used as a component of courses in nanotechnology, materials science, physics, chemistry or engineering disciplines.

Edition details

• Publisher: Wiley
• Publication date: 2011
• Language: English
• ISBN 10: 0470518510
• ISBN 13: 9780470518519
• Binding: Hardcover
• Edition number: 1
• Number of pages: 304
• Editor: Brydson Rik