X Ray Diffuse Scattering Self Organized by Schmidbauer Martin (28 results)

Condition: New. pp. 216.

Condition: New. pp. 216 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.

Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.

Hardcover. Condition: Gut. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02723 9783540201793 Sprache: Englisch Gewicht in Gramm: 550.

Condition: As New. Unread book in perfect condition.

Condition: New.

Condition: New.

Condition: New.

Condition: New.

Condition: As New. Unread book in perfect condition.

Condition: New. In English.

Condition: New. In English.

Condition: As New. Unread book in perfect condition.

Taschenbuch. Condition: Neu. X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures | Martin Schmidbauer | Taschenbuch | Springer Tracts in Modern Physics | x | Englisch | 2010 | Springer | EAN 9783642057694 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu. …

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This monograph represents a critical surveyof the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.…

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This monograph represents a critical surveyof the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.…

Condition: New. pp. 216.

Hardcover. Condition: Brand New. 1st edition. 212 pages. German language. 9.75x6.50x0.75 inches. In Stock.

Condition: new. Questo è un articolo print on demand.

Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This monograph represents a critical surveyof the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. 216 pp. Englisch.…

Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This monograph represents a critical surveyof the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. 216 pp. Englisch.…

Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Up-to-date reviewComprehensive overview: theory and experimentThis monograph represents a critical survey&nbspof the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material sy.…

Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Up-to-date reviewComprehensive overview: theory and experimentThis monograph represents a critical survey&nbspof the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material sy.…

Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This monograph represents a critical survey of the outstanding capabilities of X-raydiffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 216 pp. Englisch.…

Buch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This monograph represents a critical survey of the outstanding capabilities of X-raydiffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 216 pp. Englisch.…

Condition: New. Print on Demand pp. 216 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.

Condition: New. PRINT ON DEMAND pp. 216.

Condition: New. PRINT ON DEMAND pp. 216.