X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

Language: English

Published by Springer, Springer Vieweg Jan 2004, 2004

3540201793 / 9783540201793

Series: Book 99 of 227 - Springer Tracts in Modern Physics

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This item is printed on demand - Print on Demand Titel. Neuware -This monograph represents a critical survey of the outstanding capabilities of X-raydiffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 216 pp. Englisch.

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Title
X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures
Author
Martin Schmidbauer
Publisher
Springer, Springer Vieweg Jan 2004
Publication year
2004
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3540201793
ISBN 13
9783540201793
Item weight
494 grams
Dimensions
241x160x17 mm
Series
Book 99 of 227: Springer Tracts in Modern Physics

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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